6N136 DATASHEET PDF

Photocoupler photo-IC output. For new designs, the following product s should be used instead of this product. Inquiry Parametric search. Recommended Product For new designs, the following product s should be used instead of this product. Document select all download for selected If the checkbox is invisible, the corresponding document cannot be downloaded in batch.

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Vishay Semiconductors. High Speed Optocoupler, 1 MBd,. Photodiode with Transistor Output. Signals can be transmitted between two electrically. The potential. E, double protection. Option 7. Option 6. Option 9. UL, CSA. DIP-8, mil, option 6. SMD-8, option 7. SMD-8, option 9. For technical questions, contact: optocoupleranswers vishay.

Reverse voltage. Forward current. Peak forward current. Maximum surge forward current. Thermal resistance. Power dissipation. Supply voltage. Output voltage. Emitter base voltage. Output current. Maximum output current. I FSM. P diss. V EBO. Base current. Storage temperature range. Ambient temperature range. Soldering temperature. T stg. T amb. T sld. Functional operation of the device is not.

Exposure to absolute. Forward voltage. Breakdown voltage. Reverse current. Temperature coefficient, forward voltage. Logic low supply current.

Logic high supply current. Output voltage, output low. Output current, output high. I CCL. I CCH. Capacitance input to output. Typical values are characteristics of the device and are the result of engineering. Typical values are for information only and are not part of the testing requirements. Download 6N Datasheet. Signals can be transmitted between two electrically separated circuits up to frequencies of 2 MHz. The potential difference between the circuits to be coupled should not exceed the maximum permissible reference voltages.

Functional operation of the device is not implied at these or any other conditions in excess of those given in the operational sections of this document. Exposure to absolute maximum ratings for extended periods of the time can adversely affect reliability. Typical values are characteristics of the device and are the result of engineering evaluation.

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